Interrogation of system state for damage assessment in lead-free electronics subjected to thermo-mechanical loads.

Details

Language :

English

ISBNs :

9781424422302

Database :

Complementary Index

Journal :

2008 58th Electronic Components & Technology Conference

Publication Type :

Conference

Accession number :

80980890

Full Text :

https://doi.org/10.1109/ECTC.2008.4550086