Back to Search
Start Over
A new TDDB lifetime bi-model for eDRAM MIM capacitor with ZrO2 high-k dielectrics.
- Source :
- 2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2008, p1-4, 4p
- Publication Year :
- 2008
Details
- Language :
- English
- ISBNs :
- 9781424420391
- Database :
- Complementary Index
- Journal :
- 2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits
- Publication Type :
- Conference
- Accession number :
- 80957925
- Full Text :
- https://doi.org/10.1109/IPFA.2008.4588196