Case study of copper dendrite growth under HAST test.

Authors :: Sang-Ah Kim
Do-Seok Ahn
Yong-Hui Eum
Duck-Hyun Kim
Young-Bae Kim
Source :: 2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2008, p1-3, 3p
Publication Year :: 2008

Language :: English
ISBNs :: 9781424420391
Database :: Complementary Index
Journal :: 2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Publication Type :: Conference
Accession number :: 80957896
Full Text :: https://doi.org/10.1109/IPFA.2008.4588167