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Technology of SOI monolithic active pixel detectors for improvement of I-V characteristics and reliability.

Authors :
Niemiec, H.
Kucewicz, W.
Sapor, M.
Grabiec, P.
Kucharski, K.
Marczewski, J.
Tomaszewski, D.
Armstrong, B.M.
Bain, M.
Baine, P.
Gamble, H.S.
Suder, S. L.
Ruddell, F.H.
Source :
2008 15th International Conference on Mixed Design of Integrated Circuits & Systems; 2008, p463-465, 3p
Publication Year :
2008

Details

Language :
English
ISBNs :
9788392263272
Database :
Complementary Index
Journal :
2008 15th International Conference on Mixed Design of Integrated Circuits & Systems
Publication Type :
Conference
Accession number :
80957648