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Basic Architecture for Logic Self Repair.

Authors :
Koal, T.
Vierhaus, H.T.
Source :
2008 14th IEEE International On-Line Testing Symposium; 2008, p177-178, 2p
Publication Year :
2008

Details

Language :
English
ISBNs :
9780769532646
Database :
Complementary Index
Journal :
2008 14th IEEE International On-Line Testing Symposium
Publication Type :
Conference
Accession number :
80955804
Full Text :
https://doi.org/10.1109/IOLTS.2008.17