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Basic Architecture for Logic Self Repair.
- Source :
- 2008 14th IEEE International On-Line Testing Symposium; 2008, p177-178, 2p
- Publication Year :
- 2008
Details
- Language :
- English
- ISBNs :
- 9780769532646
- Database :
- Complementary Index
- Journal :
- 2008 14th IEEE International On-Line Testing Symposium
- Publication Type :
- Conference
- Accession number :
- 80955804
- Full Text :
- https://doi.org/10.1109/IOLTS.2008.17