Algorithms for prognostication of prior damage and residual life in lead-free electronics subjected to thermo-mechanical loads.

Details

Language :

English

ISBNs :

9781424417001

Database :

Complementary Index

Journal :

2008 11th Intersociety Conference on Thermal & Thermomechanical Phenomena in Electronic Systems

Publication Type :

Conference

Accession number :

80953270

Full Text :

https://doi.org/10.1109/ITHERM.2008.4544329