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Empirical Characteristics and Extraction of Overall Variations for 65-nm MOSFETs and Beyond.
- Source :
- 2007 IEEE Symposium on VLSI Technology; 2007, p88-89, 2p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9784900784031
- Database :
- Complementary Index
- Journal :
- 2007 IEEE Symposium on VLSI Technology
- Publication Type :
- Conference
- Accession number :
- 80925313
- Full Text :
- https://doi.org/10.1109/VLSIT.2007.4339738