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Material effects and detector response corrections for bunch length measurements.

Authors :
Zacherl, W.
Blumenfeld, I.
Hogan, M.J.
Ischebeck, R.
Clayton, C.
Muggli, P.
Zhou, M.
Source :
2007 IEEE Particle Accelerator Conference (PAC); 2007, p4147-4149, 3p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781424409167
Database :
Complementary Index
Journal :
2007 IEEE Particle Accelerator Conference (PAC)
Publication Type :
Conference
Accession number :
80919764
Full Text :
https://doi.org/10.1109/PAC.2007.4440069