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Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications.
- Source :
- 2007 IEEE International Test Conference; 2007, p1-10, 10p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9781424411276
- Database :
- Complementary Index
- Journal :
- 2007 IEEE International Test Conference
- Publication Type :
- Conference
- Accession number :
- 80916855
- Full Text :
- https://doi.org/10.1109/TEST.2007.4437582