A High-Density Subthreshold SRAM with Data-Independent Bitline Leakage and Virtual Ground Replica Scheme.

Details

Language :

English

ISBNs :

9781424408535

Database :

Complementary Index

Journal :

2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

Publication Type :

Conference

Accession number :

80912107

Full Text :

https://doi.org/10.1109/ISSCC.2007.373428