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Hot-spot detection and correction using full-chip based process window analysis.
Hot-spot detection and correction using full-chip based process window analysis.
- Source :
- 2007 Digest of papers Microprocesses & Nanotechnology; 2007, p56-57, 2p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9784990247249
- Database :
- Complementary Index
- Journal :
- 2007 Digest of papers Microprocesses & Nanotechnology
- Publication Type :
- Conference
- Accession number :
- 80884616
- Full Text :
- https://doi.org/10.1109/IMNC.2007.4456102