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Hot-spot detection and correction using full-chip based process window analysis.

Hot-spot detection and correction using full-chip based process window analysis.

Authors :
Sang-Wook Kim
Sung-Soo Suh
Young-Chang Kim
Suk-Joo Lee
Jung-Hyeon Lee
Chang-Jin Kang
Joo-Tae Moon
Source :
2007 Digest of papers Microprocesses & Nanotechnology; 2007, p56-57, 2p
Publication Year :
2007

Details

Language :
English
ISBNs :
9784990247249
Database :
Complementary Index
Journal :
2007 Digest of papers Microprocesses & Nanotechnology
Publication Type :
Conference
Accession number :
80884616
Full Text :
https://doi.org/10.1109/IMNC.2007.4456102