Trap Layer Engineered FinFET NAND Flash with Enhanced Memory Window.

Details

Language :

English

ISBNs :

9781424400058

Database :

Complementary Index

Journal :

2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers.

Publication Type :

Conference

Accession number :

80858782

Full Text :

https://doi.org/10.1109/VLSIT.2006.1705230