A New Test Generation Model for Broadside Transition Testing of Partial Scan Circuits.

Details

Language :

English

ISBNs :

9783901882197

Database :

Complementary Index

Journal :

2006 IFIP International Conference on Very Large Scale Integration

Publication Type :

Conference

Accession number :

80845872

Full Text :

https://doi.org/10.1109/VLSISOC.2006.313252