Analysis of Dynamic Avalanche Phenomenon of PiN Diode Using He Ion Irradiation.

Authors :: Misumi, T.
Nakagaki, S.
Yamaguchi, M.
Sugiyama, K.
Hirahara, F.
Nishiwaki, K.
Source :: 2006 IEEE International Symposium on Power Semiconductor Devices & IC's; 2006, p1-4, 4p
Publication Year :: 2006

Language :: English
ISBNs :: 9780780397149
Database :: Complementary Index
Journal :: 2006 IEEE International Symposium on Power Semiconductor Devices & IC's
Publication Type :: Conference
Accession number :: 80839659
Full Text :: https://doi.org/10.1109/ISPSD.2006.1666092