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Paradigm Shift for NBTI Characterization in Ultra-Scaled CMOS Technologies.
- Source :
- 2006 IEEE International Reliability Physics Symposium Proceedings; 2006, p735-736, 2p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9780780394995
- Database :
- Complementary Index
- Journal :
- 2006 IEEE International Reliability Physics Symposium Proceedings
- Publication Type :
- Conference
- Accession number :
- 80835988
- Full Text :
- https://doi.org/10.1109/RELPHY.2006.251349