Paradigm Shift for NBTI Characterization in Ultra-Scaled CMOS Technologies.

Authors :: Denais, M.
Bravaix, A.
Huard, V.
Parthasarathy, C.
Guerin, C.
Ribes, G.
Perrier, F.
Mairy, M.
Roy, D.
Source :: 2006 IEEE International Reliability Physics Symposium Proceedings; 2006, p735-736, 2p
Publication Year :: 2006

Language :: English
ISBNs :: 9780780394995
Database :: Complementary Index
Journal :: 2006 IEEE International Reliability Physics Symposium Proceedings
Publication Type :: Conference
Accession number :: 80835988
Full Text :: https://doi.org/10.1109/RELPHY.2006.251349