Endurance and Retention Characteristics of SONOS EEPROMs Operated using BTBT Induced Hot Hole Erase.

Details

Language :

English

ISBNs :

9780780394995

Database :

Complementary Index

Journal :

2006 IEEE International Reliability Physics Symposium Proceedings

Publication Type :

Conference

Accession number :

80835970

Full Text :

https://doi.org/10.1109/RELPHY.2006.251331