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Reliability of Ultra Thin Gate Oxide CMOS Devices: Design Perspective.
- Source :
- 2006 IEEE International Conference on IC Design & Technology; 2006, p1-8, 8p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9781424400973
- Database :
- Complementary Index
- Journal :
- 2006 IEEE International Conference on IC Design & Technology
- Publication Type :
- Conference
- Accession number :
- 80831656
- Full Text :
- https://doi.org/10.1109/ICICDT.2006.220808