Analysis of Factors Contributing to Common-Base Avalanche Instabilities in Advanced SiGe HBTs.

Details

Language :

English

ISBNs :

9781424404582

Database :

Complementary Index

Journal :

2006 Bipolar/BiCMOS Circuits & Technology Meeting

Publication Type :

Conference

Accession number :

80814347

Full Text :

https://doi.org/10.1109/BIPOL.2006.311151