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Electromigration effect on strain and mechanical property change in lead-free solder joints.
- Source :
- 2006 8th Electronics Packaging Technology Conference; 2006, p760-765, 6p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9781424406647
- Database :
- Complementary Index
- Journal :
- 2006 8th Electronics Packaging Technology Conference
- Publication Type :
- Conference
- Accession number :
- 80811413
- Full Text :
- https://doi.org/10.1109/EPTC.2006.342808