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Electromigration effect on strain and mechanical property change in lead-free solder joints.

Authors :
Luhua Xu
Pang, J.H.L.
Fei Ren
Xi Zhang
Jae-Woong Nah
Tu, K.N.
Source :
2006 8th Electronics Packaging Technology Conference; 2006, p760-765, 6p
Publication Year :
2006

Details

Language :
English
ISBNs :
9781424406647
Database :
Complementary Index
Journal :
2006 8th Electronics Packaging Technology Conference
Publication Type :
Conference
Accession number :
80811413
Full Text :
https://doi.org/10.1109/EPTC.2006.342808