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The locus of points of constant output VSWR around the load optimal impedance: Evaluation of power transistors robustness.
- Source :
- 2006 67th ARFTG Conference; 2006, p129-132, 4p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9780780395299
- Database :
- Complementary Index
- Journal :
- 2006 67th ARFTG Conference
- Publication Type :
- Conference
- Accession number :
- 80810127
- Full Text :
- https://doi.org/10.1109/ARFTG.2006.4734357