Subthreshold logical effort: a systematic framework for optimal subthreshold device sizing.

Details

Language :

English

ISBNs :

9781595933812

Database :

Complementary Index

Journal :

2006 43rd ACM/IEEE Design Automation Conference

Publication Type :

Conference

Accession number :

80809593

Full Text :

https://doi.org/10.1109/DAC.2006.229226