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The impact of mobility modulation technology on device performance and reliability for sub-90nm SOI MOSFETs.
- Source :
- 2005 IEEE Conference on Electron Devices & Solid-State Circuits; 2005, p91-94, 4p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780393394
- Database :
- Complementary Index
- Journal :
- 2005 IEEE Conference on Electron Devices & Solid-State Circuits
- Publication Type :
- Conference
- Accession number :
- 80788357
- Full Text :
- https://doi.org/10.1109/EDSSC.2005.1635213