An Integrated Test Platform for Nanostructure Electrical Characterization.

Authors :: Duval, O.
Lafrance, L.-P.
Savaria, Y.
Desjardins, P.
Source :: 2004 International Conference on MEMS, NANO & Smart Systems (ICMENS'04); 2004, p237-242, 6p
Publication Year :: 2004

Language :: English
ISBNs :: 9780769521893
Database :: Complementary Index
Journal :: 2004 International Conference on MEMS, NANO & Smart Systems (ICMENS'04)
Publication Type :: Conference
Accession number :: 80781113
Full Text :: https://doi.org/10.1109/ICMENS.2004.1508953