Reliability evaluation of Gilbert cell mixer based on a hot-carrier stressed device degradation model.

Details

Language :

English

ISBNs :

9780780383333

Database :

Complementary Index

Journal :

2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers

Publication Type :

Conference

Accession number :

80778686

Full Text :

https://doi.org/10.1109/RFIC.2004.1320630