Study of data retention for nanocrystal Flash memories.

Authors :: Compagnoni, C.M.
Ielmini, D.
Spinelli, A.S.
Lacaita, A.L.
Previtali, C.
Gerardi, C.
Source :: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual; 2003, p506-512, 7p
Publication Year :: 2003

Language :: English
ISBNs :: 9780780376496
Database :: Complementary Index
Journal :: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual
Publication Type :: Conference
Accession number :: 80774482
Full Text :: https://doi.org/10.1109/RELPHY.2003.1197800