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Time to breakdown and voltage to breakdown modeling for ultra-thin oxides (Tox<32Å).
- Source :
- 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580); 2001, p20-25, 6p
- Publication Year :
- 2001
Details
- Language :
- English
- ISBNs :
- 9780780371675
- Database :
- Complementary Index
- Journal :
- 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)
- Publication Type :
- Conference
- Accession number :
- 80768840
- Full Text :
- https://doi.org/10.1109/.2001.993911