Evidence for recombination at oxide defects and new SILC model.

Authors :: Ielmini, D.
Spinellii, A.S.
Lacaita, A.L.
Ghidini, G.
Source :: 2000 IEEE International Reliability Physics Symposium Proceedings 38th Annual (Cat. No.00CH37059); 2000, p55-64, 10p
Publication Year :: 2000

Language :: English
ISBNs :: 9780780358607
Database :: Complementary Index
Journal :: 2000 IEEE International Reliability Physics Symposium Proceedings 38th Annual (Cat. No.00CH37059)
Publication Type :: Conference
Accession number :: 80765275
Full Text :: https://doi.org/10.1109/RELPHY.2000.843891