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False Path Identification using RTL Information and Its Application to Over-testing Reduction for Delay Faults.

Authors :
Yoshikawa, Y.
Ohtake, S.
Fujiwara, H.
Source :
16th Asian Test Symposium (ATS 2007); 2007, p65-68, 4p
Publication Year :
2007

Details

Language :
English
ISBNs :
9780769528908
Database :
Complementary Index
Journal :
16th Asian Test Symposium (ATS 2007)
Publication Type :
Conference
Accession number :
80758720
Full Text :
https://doi.org/10.1109/ats.2007.4387984