A device array for efficient bias-temperature instability measurements.

Authors :: Sato, T.
Kozaki, T.
Uezono, T.
Tsutsui, H.
Ochi, H.
Source :: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 2011, p143-146, 4p
Publication Year :: 2011

Language :: English
ISBNs :: 9781457707070
Database :: Complementary Index
Journal :: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)
Publication Type :: Conference
Accession number :: 80398242
Full Text :: https://doi.org/10.1109/ESSDERC.2011.6044214