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The field modulation effect of fluoride plasma treatment on blocking characteristics of AlGaN/GaN HEMT.

Authors :
Young-shil Kim
Seok, O.G.
Min Woo Ha
Min Koo Han
Source :
2011 18th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2011, p1-5, 5p
Publication Year :
2011

Details

Language :
English
ISBNs :
9781457701597
Database :
Complementary Index
Journal :
2011 18th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA)
Publication Type :
Conference
Accession number :
80389845
Full Text :
https://doi.org/10.1109/IPFA.2011.5992728