Boosting power to detect genetic associations in imaging using multi-locus, genome-wide scans and ridge regression.

Details

Language :

English

ISBNs :

9781424441273

Database :

Complementary Index

Journal :

2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro

Publication Type :

Conference

Accession number :

80373527

Full Text :

https://doi.org/10.1109/ISBI.2011.5872769