Back to Search
Start Over
Understanding customer returns from a test perspective.
- Source :
- 2011 IEEE 29th VLSI Test Symposium (VTS); 2011, p2-7, 6p
- Publication Year :
- 2011
Details
- Language :
- English
- ISBNs :
- 9781612846576
- Database :
- Complementary Index
- Journal :
- 2011 IEEE 29th VLSI Test Symposium (VTS)
- Publication Type :
- Conference
- Accession number :
- 80367999
- Full Text :
- https://doi.org/10.1109/VTS.2011.5783746