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Optimal design for step-stress accelerated degradation testing based on D-optimality.

Authors :
Zhengzheng Ge
Xiaoyang Li
Tongmin Jiang
Tingting Huang
Source :
2011 Proceedings - Annual Reliability & Maintainability Symposium (RAMS); 2011, p1-6, 6p
Publication Year :
2011

Details

Language :
English
ISBNs :
9781424488575
Database :
Complementary Index
Journal :
2011 Proceedings - Annual Reliability & Maintainability Symposium (RAMS)
Publication Type :
Conference
Accession number :
80354616
Full Text :
https://doi.org/10.1109/RAMS.2011.5754481