Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement.

Details

Language :

English

ISBNs :

9781424482931

Database :

Complementary Index

Journal :

2011 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

Publication Type :

Conference

Accession number :

80353460

Full Text :

https://doi.org/10.1109/RFIC.2011.5940716