Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems.

Details

Language :

English

ISBNs :

9781424451173

Database :

Complementary Index

Journal :

General Assembly & Scientific Symposium, 2011 XXXth URSI

Publication Type :

Conference

Accession number :

80309066

Full Text :

https://doi.org/10.1109/URSIGASS.2011.6050666