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Revisiting Application-Dependent Test for FPGA Devices.

Authors :
Cilardo, A.
Lofiego, C.
Mazzeo, A.
Mazzocca, N.
Source :
European Test Symposium (ETS), 2011 16th IEEE; 2011, p213-213, 1p
Publication Year :
2011

Details

Language :
English
ISBNs :
9781457704833
Database :
Complementary Index
Journal :
European Test Symposium (ETS), 2011 16th IEEE
Publication Type :
Conference
Accession number :
80306000
Full Text :
https://doi.org/10.1109/ETS.2011.54