45nm Yield model optimization.

Authors :: Walsh, B.L.
Colt, J.
Poindexter, D.
Joseph, T.
Source :: Advanced Semiconductor Manufacturing Conference (ASMC), 2011 22nd Annual IEEE/SEMI; 2011, p1-4, 4p
Publication Year :: 2011

Language :: English
ISBNs :: 9781612844084
Database :: Complementary Index
Journal :: Advanced Semiconductor Manufacturing Conference (ASMC), 2011 22nd Annual IEEE/SEMI
Publication Type :: Conference
Accession number :: 80254086
Full Text :: https://doi.org/10.1109/ASMC.2011.5898162