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Dependence of Substrate Orientation and Etching Conditions on the Formation of Si Nanowires.

Authors :
Tan, Lay Theng
Huang, Ming Hui
Chong, Ting Sheng
Ong, Chih Soon
Myo, Thet Sun
Wee, Qixun
Soh, Chew Beng
Chua, Soo Jin
Source :
AIP Conference Proceedings; 5/25/2011, Vol. 1341 Issue 1, p292-295, 4p, 3 Black and White Photographs, 1 Chart
Publication Year :
2011

Abstract

In this paper, an electroless etching using a mixed solution of hydrofluoric acid and silver nitrite on (100) and (111) silicon substrates was conducted which led to the formation of well-aligned nanowire arrays. In (100) silicon substrate, the density of nanowires networks are much wider apart than that in (111) Si substrate. In addition, the length of the nanowires in (100) Si substrate is almost two times longer than that on (111) Si substrate. It is possibly due to the fact of the orientation where the atoms are much closer packed together in (111), indicating that the process may require more energy to etch deeper and wider. It is also observed the length of SiNWs has increased when the etching temperature increases from 25° C to 50° C. Similar behavior is also noted as the hydrofluoric acid molar concentration increases from 1M to 5 M. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1341
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
79656496
Full Text :
https://doi.org/10.1063/1.3587004