Towards Process Variation-Aware Power Gating.

MLA

Yeh, Chingwei, et al. “Towards Process Variation-Aware Power Gating.” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 20, no. 11, Nov. 2012, pp. 1929–37. EBSCOhost, https://doi.org/10.1109/TVLSI.2011.2169435.

APA

Yeh, C., Chen, Y.-C., & Wang, J.-S. (2012). Towards Process Variation-Aware Power Gating. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 20(11), 1929–1937. https://doi.org/10.1109/TVLSI.2011.2169435

Chicago

Yeh, Chingwei, Yuan-Chang Chen, and Jinn-Shyan Wang. 2012. “Towards Process Variation-Aware Power Gating.” IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (11): 1929–37. doi:10.1109/TVLSI.2011.2169435.