An electrospray/inductively coupled plasma dual-source time-of-flight mass spectrometer for rapid metallomic and speciation analysis Part 2. Atomic channel and dual-channel characterization.

Details

Language :

English

ISSN :

17565901

Issue :

4

Database :

Complementary Index

Journal :

Metallomics

Publication Type :

Academic Journal

Accession number :

78003854

Full Text :

https://doi.org/10.1039/b915783b