Back to Search
Start Over
Comparison of the Sensitivity to Heavy Ions of 0.25-ยต m Bulk and SOI Technologies.
- Source :
- IEEE Transactions on Nuclear Science; Jun2002 Part 3 of 4, Vol. 49 Issue 3, p1450, 6p, 3 Diagrams, 3 Charts, 4 Graphs
- Publication Year :
- 2002
-
Abstract
- Focuses on a study that investigated the sensitivity to heavy ions of nonhardened 0.25-µ m partially depleted silicon on insulator and bulk technologies with experiments, device, and circuit simulations. Devices, experiments and simulations; Heavy ion results; Discussion; Conclusion.
- Subjects :
- HEAVY ions
SILICON-on-insulator technology
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 49
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 7679921
- Full Text :
- https://doi.org/10.1109/TNS.2002.1039682