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Epitaxial Growth and Selective Etching Techniques.

Authors :
Angelopoulos, Evangelos A.
Kaiser, Alexander
Source :
Ultra-thin Chip Technology & Applications; 2011, p53-60, 8p
Publication Year :
2011

Abstract

In this chapter a wafer-level thinning technique is presented, where, similar to what is discussed in Chapter 8, epitaxial growth of silicon (Si) determines the final chip thickness. A combination of backside grinding and selective wet chemical etching is used for thinning down the initial substrate. Since wafer bonding and grinding were thoroughly addressed in Chapters 4 and 5, this subsection deals only with the other key processing steps, namely the wet chemical etching of Si and the epitaxial growth of highly boron-doped Si required to trigger the etch selectivity. Finally, process parameters and significant results based on this technique are summarised. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISBNs :
9781441972750
Database :
Complementary Index
Journal :
Ultra-thin Chip Technology & Applications
Publication Type :
Book
Accession number :
76779535
Full Text :
https://doi.org/10.1007/978-1-4419-7276-7_6