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High spatial resolution quantitative micromagnetics (invited).

Authors :
Scheinfein, M. R.
Unguris, J.
Pierce, D. T.
Celotta, R. J.
Source :
Journal of Applied Physics; 5/1/1990, Vol. 67 Issue 9, p5932, 6p, 1 Black and White Photograph, 2 Diagrams, 2 Graphs
Publication Year :
1990

Abstract

Provides information on a study which observed magnetization profiles at surfaces with scanning electron microscopy and polarization analysis. Calculation of micromagnetic equation using energy minimization; Dependence of the domain wall magnetization on sample thickness; Contrast between the Bitter technique and magnetic force microscopy.

Details

Language :
English
ISSN :
00218979
Volume :
67
Issue :
9
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7668316
Full Text :
https://doi.org/10.1063/1.346018