Line-shape analysis of reflectance spectra from GaAs/AlAs multiple-quantum-well structures.

Authors :: Terzis, A. F.
Liu, X. C.
Petrou, A.
McCombe, B. D.
Dutta, M.
Shen, H.
Smith, Doran D.
Cole, M. W.
Taysing-Lara, M.
Newman, P. G.
Source :: Journal of Applied Physics; 3/1/1990, Vol. 67 Issue 5, p2501, 5p, 1 Black and White Photograph, 2 Charts, 2 Graphs
Publication Year :: 1990
Abstract: Presents information on a study which analyzed the line shape reflectance spectroscopy from gallium arsenic/aluminum arsenic multiple-quantum-well structures. Description of the model; Factors that affect the detail of line shape; Characteristics of the gallium arsenic/aluminum arsenic structure.

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