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Oxygen-related 1-platinum defects in silicon: An electron paramagnetic resonance study.

Authors :
Juda, U.
Scheerer, O.
Höhne, M.
Riemann, H.
Schilling, H.-J.
Donecker, J.
Gerhardt, A.
Source :
Journal of Applied Physics; 9/15/1996, Vol. 80 Issue 6, p3435, 10p
Publication Year :
1996

Abstract

Focuses on a study which investigated monoclinic 1-platinum defects in silicon by electron paramagnetic resonance. Information on self-interstitial related defects; Methodology of the study; Results and discussion.

Details

Language :
English
ISSN :
00218979
Volume :
80
Issue :
6
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7664024
Full Text :
https://doi.org/10.1063/1.363212