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Exchange biasing in MBE grown Fe3O4/CoO bilayers: The antiferromagnetic layer thickness dependence.

Authors :
van der Zaag, P. J.
Ball, A. R.
Feiner, L. F.
Wolf, R. M.
van der Heijden, P. A. A.
Source :
Journal of Applied Physics; 4/15/1996, Vol. 79 Issue 8, p5103, 3p
Publication Year :
1996

Abstract

Provides information on a study which investigated exchange biasing in molecular beam epitaxy grown iron compound bilayers. Methods; Results; Discussion.

Details

Language :
English
ISSN :
00218979
Volume :
79
Issue :
8
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7661362
Full Text :
https://doi.org/10.1063/1.361315