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Studies of binding energies of various components in bismuth-based cuprate superconductors through secondary ion mass spectrometry and x-ray photoelectron spectroscopy.
- Source :
- Journal of Applied Physics; 1/1/1995, Vol. 77 Issue 1, p343, 7p, 3 Charts, 9 Graphs
- Publication Year :
- 1995
-
Abstract
- Presents a surface analysis of bismuth-based cuprates superconductors through secondary ion mass spectrometry and X-ray photoelectron spectroscopy. Properties of cuprates superconductors; Discussion on kinetic energy distributions for secondary negative ions; Explanation for the emission of small clusters in bismuth-based cuprates.
- Subjects :
- SURFACE analysis
SUPERCONDUCTORS
SECONDARY ion mass spectrometry
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 77
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7659103
- Full Text :
- https://doi.org/10.1063/1.359327