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Dielectric relaxation in amorphous thin films of SrTiO3 at elevated temperatures.
- Source :
- Journal of Applied Physics; 8/1/1995, Vol. 78 Issue 3, p1914, 6p, 9 Graphs
- Publication Year :
- 1995
-
Abstract
- Investigates temperature and frequency dispersion of dielectric permittivity on thin amorphous films of strontium-titanium-oxygen prepared by a sputtering method using neutralized argon-ion beams. Analysis of the temperature dependence of relaxation time; Ways to characterize the dielectric relaxation phenomena in amorphous thin films; Application of ion-beam sputtering method.
- Subjects :
- THIN films
STRONTIUM compounds
SPUTTERING (Physics)
ION bombardment
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 78
- Issue :
- 3
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7658483
- Full Text :
- https://doi.org/10.1063/1.360228