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Characterization of AlAs/GaAs superlattice barriers using electrical barrier height analysis.
- Source :
- Journal of Applied Physics; 11/1/1988, Vol. 64 Issue 9, p4765, 3p, 1 Diagram, 3 Charts, 1 Graph
- Publication Year :
- 1988
-
Abstract
- Presents a study that investigated the characteristics of aluminum arsenide/gallium arsenide superlattice barriers using electrical barrier height analysis. Methodology; Determination of the superlattice barrier layer thickness; Comparison of the superlattice barrier of gallium arsenide and aluminum arsenide.
- Subjects :
- SUPERLATTICES
GALLIUM arsenide semiconductors
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 64
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 7656411
- Full Text :
- https://doi.org/10.1063/1.341194