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Characterization of AlAs/GaAs superlattice barriers using electrical barrier height analysis.

Authors :
Paulus, M. J.
Huang, C. I.
Bozada, C. A.
Cheney, M. E.
Dudley, S. C.
Stutz, C. E.
Evans, K. R.
Jones, R. L.
Source :
Journal of Applied Physics; 11/1/1988, Vol. 64 Issue 9, p4765, 3p, 1 Diagram, 3 Charts, 1 Graph
Publication Year :
1988

Abstract

Presents a study that investigated the characteristics of aluminum arsenide/gallium arsenide superlattice barriers using electrical barrier height analysis. Methodology; Determination of the superlattice barrier layer thickness; Comparison of the superlattice barrier of gallium arsenide and aluminum arsenide.

Details

Language :
English
ISSN :
00218979
Volume :
64
Issue :
9
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7656411
Full Text :
https://doi.org/10.1063/1.341194