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EL2 and anion antisite defects in plastically deformed GaAs.

Authors :
Hofmann, D. M.
Meyer, B. K.
Spaeth, J.-M.
Wattenbach, M.
Krüger, J
Kisielowski-Kemmerich, C.
Alexander, H.
Source :
Journal of Applied Physics; 10/1/1990, Vol. 68 Issue 7, p3381, 5p
Publication Year :
1990

Abstract

Discusses the investigation on the structure of the deformation-induced As[subGa] defects and resolve characteristic properties which allow to distinguish between those defects and the arsenic-grown EL2 defect. Details of the experiment; Change in the optical absorption as a function of the degree of deformation.

Details

Language :
English
ISSN :
00218979
Volume :
68
Issue :
7
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7656188
Full Text :
https://doi.org/10.1063/1.346341